After a PhD in materials science from North Carolina State University, Dr. Hacke worked on GaN LED and laser diode materials at Nagoya University, AIST, and Fujitsu Laboratories in Japan.  He started work in the crystalline silicon PV cell and module industry in 2000 and moved to NREL in 2009 where he initiated the NREL work on potential-induced degradation and IEC standards in PV module and inverter reliability. His research is focused on PV durability test methods and modeling.