- Scanning Probe Microscopy: Atomic Force Microscopy, Scanning Tunneling Microscopy, Scanning Near Field Microscopy.
- Raman Scattering Confocal Microscopy. SPM + Raman Microscopy, TERS.
- Thin film investigation.
Conducting Lengmuir-Blodgett films of binary mixtures of donor and acceptor molecules
S.V.Ayrapetiants, T.S.Berzina, S.A.Shikin and V.I.Troitsky
Thin Solid Films, 210/211, 261-264, (1992)
The influence of Structure change on Electrical properties of conducting LB films produced from hexadecyl-TCNQ and ...
T.S.Berzina, S.A.Shikin and V.I.Troitsky
Makromol. Chem., Macromol. Symp., 46, 223-227, (1991)
STM and AFM investigation of porous silicon - conjugated polymer structure
V.L. Kustov, V.S. Korsakov, A.G. Borisov, L.A. Plavich, А.А. Sigarev, S.A. Shikin
Book of abstracts, p.264, (-)
- M.Sc., Physic Engineering, Moscow Institute of Physics and Technology, Russia, 1990.
- 2017 - now: Senior Technical Specialist, KAUST Solar Center
- 1993 - 2017: Senior Field Engineer, Researcher, NT-MDT Co. Moscow, Russia
- 1990 - 1993: Researcher, Research Institute of Physical Problems, Zelenograd, Moscow, Russia
- KAUST Solar Center (KSC)
- Division of Physical Science and Engineering (PSE)
5;#Lab Operation Staff