lab features a wide range of microscopy, spectroscopy and fluorimetry
techniques ranging from bench-top SEM to quantitative nanoscale material
property mapping AFM, and from broad-spectrum photoluminescence to
photoelectron spectroscopy in air (PESA) for the optical and structural
characterization of organic, inorganic and hybrid thin-film solutions and
materials. The capstone of this facility is the inclusion of three J.A. Woollam
ellipsometers that together span the spectral range of 140 nm to 33,000 nm.