Surface Analysis Laboratory

Surface Analysis Laboratory

The Surface Analysis Lab features a wide range of spectroscopic, scanning probe and optical microscopy techniques for the optical and structural characterization of organic, inorganic and hybrid thin-film materials. The equipment ranges from bench-top SEM to nanoscale material property mapping AFM, and from broad-spectrum photoluminescence to photoelectron spectroscopy in air (PESA). Three J.A. Woollam ellipsometers are available for electro-optical and structural characterization of thin-films and monolayers in the range of 140 nm to 33,000 nm.

Facilities

  • 3D Optical Profiler Brand: Bruker,
    Model: ContourGT-X8
    3D Optical Profiler The ContourGT model is a 3D optical microscope based on white light interferometry (WLI) technology.
  • X-ray Fluorescence Brand: Bruker,
    Model: M4 TORNADO
    X-ray Fluorescence The M4 TORNADO is an analytical tool for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) to obtain information on composition and element distribution.
  • UV-Vis-NIR Spectrophotometer Brand: Varian,
    Model: Cary 5000
    UV-Vis-NIR Spectrophotometer The Cary 5000 is a high performance UV-Vis-NIR spectrophotometer. Using two light sources (Deuterium UV lamp and QI Vis lamp) on the excitation side and a photomultiplier tube and a PbS NIR detector on the detection side, it can measure the optical transmittance of thin-films and liquids in the extended photometric range 175 – 3300 nm.
  • UV-Vis-NIR Spectrophotometer Brand: Varian,
    Model: Cary 6000i
    UV-Vis-NIR Spectrophotometer The Cary 6000i is a high-performance UV-Vis-NIR spectrophotometer equipped with a narrow band InGaAs detector in addition to a photomultiplier tube for improved linearity and measurements in the range 175 – 1800 nm.
  • Atomic Force Microscope Brand: Bruker,
    Model: Dimension Icon with ScanAsyst
    Atomic Force Microscope The Atomic Force Microscope System - Bruker Dimension Icon with ScanAsyst® for scanning probe microscopy is capable of nanoscale surface topography and morphology measurements of a range of different surface types producing high resolution, three-dimensional images by scanning a sharp probe over the sample surface.
  • Atomic Force Microscope Brand: NT-MDT,
    Model: Next
    Atomic Force Microscope The Next is designed to facilitate AFM measurements with user friendly control features such as an automated approach of the cantilever to the surface and high resolution optical microscope positioning.
  • Scanning Probe Microscope (TERS, SNOM, AFM) Brand: NT-MDT,
    Model: NTEGRA Spectra
    Scanning Probe Microscope (TERS, SNOM, AFM) The NTEGRA provides a unique combination of scanning probe with Raman spectroscopy and laser confocal microscopy to study the distribution of chemical properties with nanometer resolution.
  • Ellipsometer M2000 Brand: J. A. Woollam,
    Model: M-2000 DI
    Ellipsometer M2000 The J. A. Woollam M-2000 DI spectroscopic ellipsometer provides fast and accurate thin film characterization over a wide spectroscopic range.
  • Photoelectron Spectroscopy in Air Brand: Hitachi,
    Model: AC-2
    Photoelectron Spectroscopy in Air The Model AC-2 is an instrument for Photoelectron Spectroscopy at atmospheric pressure that is with an open counter detector and a UV source.
  • Spectrofluorometer Brand: Horiba,
    Model: Nanolog
    Spectrofluorometer The Nanolog is a highly modular photoluminescence system, which allows interchanging a versatile range of computer-controlled accessories to measure the steady-state and time-resolved fluorescence of solids, powders, thin-films and liquids.
  • Spectrofluorometer Brand: Horiba,
    Model: Fluoromax-4
    Spectrofluorometer The Horiba FluoroMax 4 spectrometer allows for measuring fluorescence of solids, liquids, powders and thin films. The instrument is controlled by FluorEssenceTM software with Origin embedded for sophisticated data analysis.
  • Stereomicroscope Brand: Zeiss,
    Model: Discovery V-20
    Stereomicroscope This stereomicroscope is designed for optimal depth perception and maximum zoom range. A 20:1 zoom range allows to go from largest overview into the smallest details.
  • Hall Effect Measurement Brand: Lake Shore,
    Model: 8400 Series
    Hall Effect Measurement The Lake Shore 8400 Series can be used with both DC and AC field Hall measurement methodologies. The system includes fully integrated instrumentation, a magnet and power supply.
  • Optical Microscope Brand: Zeiss,
    Model: Axio observer Z1M
    Optical Microscope Microscope Axio Observer.Z1 for brightfield, phase contrast, differential interference contrast and fluorescence imaging. This microscope features a wide range of magnification objectives, flexible accessory ports and digital image acquisition (CCD).
  • Benchtop SEM Brand: NeoScope,
    Model: JCM-5000
    Benchtop SEM The NeoScope JCM-5000 benchtop SEM complements both optical microscopes and traditional SEMs in the lab, and can be configured for advanced analytical applications.