NanoCalc-XR is a versatile and configurable thin film measurement system. It is based on spectroscopic reflectometry to accurately determine optical or non-optical thin film thickness. It is suitable for applications in a variety of semiconductor applications. NanoCalc system measures anti-reflective coatings, anti-scratch coatings and rough layers on substrates such as steel, aluminum, brass, copper, ceramics and plastics. The NanoCalc-XR thin film reflectometry system allows you to analyze the thickness of optical layers (single-layer or multilayer films) from 10 nm to 100 µm (Wavelength range 250-1050 nm).