Brand: J. A. Woollam
The J. A. Woollam IR-VASE® spectroscopic ellipsometer combines the chemical sensitivity of FTIR spectroscopy with thin film sensitivity of spectroscopic ellipsometry. The IR-VASE covers the spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). It is used to characterize both thin films and bulk materials in research and industry. This instrument is particularly useful for characterizing optical coatings, semiconductors, thin nanoscopic films and self-assembled monolayers.
The IR-VASE can characterize: