This multi-functional facility allows fabrication of organic, inorganic and hybrid semiconductor devices based on a wide range of processing methods in controlled and inert environment. In addition to standard device characterization equipment, the lab offers advanced equipment for PV device analysis in inert atmospheres (28 gloveboxes).
This facility hosts research equipment under inert environment including:
We carry five thin film deposition systems from Angstrom Engineering for thermally depositing a wide range of materials including metals, organic and inorganic small molecules. The deposition rate is controlled using quartz crystal sensors to ensure consistent, high-quality film formation.
Our two systems are configured to support two types of vacuum sputter deposition: RF sputtering, DC sputtering. Each of these deposition methods uses a process sputter gas, which is usually an inert gas like argon with reactive gases added for certain processes.
We are using our e-Beam deposition system to deposit thick films of all kinds of metals, and many metal oxides for solar cell applications.
Abet Technologies offer a wide range of ASTM, IEC, and JIS standards compliant solar simulators ranging from 150W to 3kW with one sun or greater, illuminated field sizes from 50 x 50 mm to 35 x 35 cm.
Permits simultaneous measurements of both the external quantum efficiency (EQE) and the internal quantum efficiency (IQE) of solar cells, detectors, or any photon-to-charge converting devices.
Oriel Sol3A solar simulators use a single lamp design to meet Class A requirements for three performance criteria without compromising the 1 Sun output power. This solar simulator fulfills class AAA, with the first letter representing Spectral performance, the second letter Uniformity of Irradiance, and the third letter Temporal Stability. Active area size: 6x6 inches, Air Mass 1.5G Filter, Xenon Arc Lamp.
The Paios system from Fluxim performs a variety of electrical and opto-electronic technique to extract charge carrier mobility, recombination kinetics and doping density of thin films.
The Kelvin probe is a non-contact, non-destructive vibrating capacitor device used to measure the work function (WF) of conducting materials or surface potential (SP) of semiconductor or insulating surfaces. This system from KP Technology offers a WF resolution of 1-3 meV. The high-resolution 3-axis translation stage allows performing 50 x 50 mm 2D scans. The Kelvin probe is set up inside a Faraday and light enclosure to prevent from unwanted electromagnetic interferences.
The P-7 stylus profiler from TENCOR is a surface measurement system with 150 mm scan length standard. It offers good measurement repeatability and reliable height measurements of up to 50 nanometers. Its sensor includes dynamic force control, excellent linearity, and high vertical resolution. Finally, this stylus profiler's surface measurement system includes point-and-click operation.
The DSA100 is a high-quality instrument for analyzing wetting and adhesion on solid surfaces. With up to three axes for sample positioning, the sample is moved quickly and reproducibly to the measuring positions. Measurement of the contact angle with up to 4 liquids ensures maximum accuracy when determining the surface free energy.
An optical microscope with improved three-dimensional image perception. It helps the user to prepare and manipulate samples. Image acquisition is supported by 8:1 zoom range. The selectable click-stops for discrete magnification steps allows the user to calibrate pixel sizes in the imaging software packages ZEN and AxioVision.
This high end, high current potentiostat/galvanostat, with a compliance voltage of 30 V and a bandwidth of 1 MHz is specially designed for electrochemical impedance spectroscopy, with a maximum current of 2 A, the current resolution is 30 fA at a current range of 10 nA.
A combination of Agilent 78790B gas chromatography and Asahi Spectra MAX 303 solar simulators to measure hydrogen evolution from photocatalysis.